English  |  正體中文  |  简体中文  |  Items with full text/Total items : 94286/110023 (86%)
Visitors : 21694717      Online Users : 854
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/9811


    Title: 灰關聯分析應用於半導體業聲望評價之研究
    Authors: 林士彥;蔡碩倉;林銘昌
    Keywords: 企業聲望;多屬性決策;灰關聯分析;Business Reputation;Multiple Attribute Decision Making;Grey Relational Analysisa
    Date: 2005-06
    Issue Date: 2010-06-02 11:51:00 (UTC+0)
    Publisher: Asia University
    Abstract: 本研究運用多屬性決策 (Multiple Attribute Decision Making, MADM) 來進行半導體業的企業聲望評價與績效評估,期能為半導體業者提供標竿學習之重要指標、電腦資訊相關業者提供一個簡易評選供應商之方法、投資者評估出較適合投資之標的,或是提供與即將踏入社會之新鮮人作為評估就業目標的重要參考指標之一。當有為數不少的半導體業可供評選,又有許多評估因子需要同時考慮,此時透過多屬性決策之灰關聯分析 (Grey Relational Analysis, GRA) 技術的輔助來評估出較適合之半導體業,此類決策方法對解決多目標間的衝突與矛盾、彼此優先次序不同的問題非常有效。透過灰關聯分析亦可以進一步的探討在不同的決策者喜好之下,各家半導體業整體表現之不同點。 This research applies techniques of the Multiple Attribute Decision Making (MADM), such as Simple Additive Weighting method (SAW), Grey Relational Analysis (GRA) , to prioritize the business reputation of the eight companies in semiconductor manufacturers with different parameters and weights settings. While evaluating various attributes among numerous manufacturers, the Multiple Criteria Decision Making method is practically effective on selecting the best company in semiconductor manufacturers.
    Relation: 產業論壇 7(2) : 67-88
    Appears in Collections:[休閒與遊憩管理學系] 期刊論文

    Files in This Item:

    File Description SizeFormat
    0KbUnknown397View/Open
    310904400-9811.doc34KbMicrosoft Word122View/Open


    All items in ASIAIR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback