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    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/80683


    Title: Preparation and optoelectronic characteristics analysis of Cu2ZnSnS4:O thin films
    Authors: Hung, Ta-Chun
    Contributors: 光電與通訊學系
    Keywords: Sol-gel
    Cu2ZnSnS4:O
    Structure
    Composition
    Optoelectronic properties
    Date: 2014-07-31
    Issue Date: 2014-09-03 01:28:27 (UTC+0)
    Publisher: Asia University
    Abstract: This study used sol-gel method to prepare Cu2ZnSnS4:O film materials. Correlations between structural and optoelectronic characteristics of the Cu2ZnSnS4:O film were discussed. The Cu2ZnSnS4:O films had a kesterite structure of non-stoichiometric compositions. The oxygen content of 8.89 and 10.30 at.% which changed the microstructure and optoelectronic properties of Cu2ZnSnS4:O materials. With the increase of the oxygen contents, the transmittances of the films become obvious. Direct band gaps of Cu2ZnSnS4:O films were 3.48 and 3.55 eV, respectively. The materials are wide band gap semiconductor. The Cu2ZnSnS4:O films had absorption coefficients of >104cm-1, and resistivities of 19.68 and 5.86 Ωcm.
    Appears in Collections:[光電與通訊學系] 博碩士論文

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