Study of Different Spatial Charge Trapping distribution effect on off-state degradation

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Title:	Study of Different Spatial Charge Trapping distribution effect on off-state degradation
Authors:	Erry(Erry)、Vivek(Vivek)、許健(Gene Sheu)、Antonious(Antonious)、hema(hema)、楊紹明(Shao-Ming, Yang)、P.A.Chen(P.A.Chen)
Contributors:	資訊工程學系
Date:	201405
Issue Date:	2014-11-13 07:03:09 (UTC+0)
Relation:	2014 IEEE 8th International Power Engineering and Optimization Conference (PEOCO2014), Langkawi, The Jewel of Kedah,
Appears in Collections:	[資訊工程學系] 期刊論文

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