ASIA unversity:Item 310904400/8684
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 94286/110023 (86%)
Visitors : 21671558      Online Users : 1092
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/8684


    Title: Fault diameter of hypercubes with hybrid node and link faults
    Authors: Kung, Tzu-Liang;Lin, Cheng-Kuan;Liang, Tyne;Hsu, Li-Yen;Tan, Jimmy J.M.
    Contributors: Department of Computer Science and Information Engineering
    Keywords: Fault tolerance;Geometry;Interconnection networks;Conditional fault;Diameter;Fault diameter;Fault-free nodes;Hyper-cubes;Hypercube
    Date: 2009
    Issue Date: 2010-04-07 13:27:20 (UTC+0)
    Publisher: Asia University
    Abstract: In this paper we study the fault diameter of the n-dimensional hypercube (or n-cube for short), Q<inf>n</inf>, for n ≥ 3. Let F be a set of hybrid node-faults and/or link-faults in Q<inf>n</inf> such that every node of Q<inf>n</inf> is still connected to at least one fault-free node by a fault-free link. Then we compute the exact diameter of Q<inf>n</inf> - F for/F/&le 2n - 3. As an immediate consequence, our result improves upon those presented by S. Latifi (1993), in which only node-faults were addressed. © 2009 World Scientific Publishing Company.
    Relation: Journal of Interconnection Networks 10(3) :233-242
    Appears in Collections:[Department of Computer Science and Information Engineering] Journal Artical

    Files in This Item:

    File Description SizeFormat
    0KbUnknown563View/Open
    45.doc30KbMicrosoft Word298View/Open


    All items in ASIAIR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback