English  |  正體中文  |  简体中文  |  Items with full text/Total items : 94286/110023 (86%)
Visitors : 21690148      Online Users : 551
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/81352


    Title: Automatic optical inspection system for IC molding surface
    Authors: Perng), 陳思翰(Ssu-Han Chen)*、彭德保(Der-Baau
    Contributors: 資訊多媒體應用學系
    Date: 201406
    Issue Date: 2014-10-08 06:04:18 (UTC+0)
    Abstract: Success or failure of an IC product hinges on the quality of molding process which protects chips from the harm done by external force and moisture. Defects such as cracks, dilapidations or voids may be embedding on the molding surface while a chip was being molded. Human inspection often neglects a very tiny crack or a low-contrast void. Hence an automatic optical inspection system for the integrated circuit (IC) molding surface cannot be over emphasized. The proposed system is composed of a charged coupled device, a coaxial light, a back light and a motion control unit. Based on the characteristics of statistical textures of the molding surface, a series of digital image processing is carried out, including normalization, shrinking, segmenting and Fourier based image restoration and defect identification. Training of the parameter associated with defect inspection algorithm is also discussed. Results of the experiment suggest that the inspection system works effectively with high accuracy rate of 94.2 %, contributing to the inspection quality of IC molding surface.
    Relation: JOURNAL OF INTELLIGENT MANUFACTURING
    Appears in Collections:[行動商務與多媒體應用學系] 期刊論文

    Files in This Item:

    File SizeFormat
    index.html0KbHTML307View/Open


    All items in ASIAIR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback