ASIA unversity:Item 310904400/78584
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 94286/110023 (86%)
Visitors : 21653937      Online Users : 350
RC Version 6.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/78584


    Title: A Calibration Test Prototype of Flickermeter for Wind Turbines
    Authors: 陳正一;陳永欽;CHEN, YEONG-CHIN
    Contributors: 資訊工程學系
    Date: 2012.07
    Issue Date: 2013-12-26 10:22:36 (UTC+0)
    Abstract: Voltage fluctuations caused by the rapid changes of loads in the power system may give rise to noticeable illumination flickers of lighting equipments. Evaluation of voltage fluctuation becomes an important issue for the grid integration of wind energy systems. To provide accurate estimation of grid situations, a calibration test prototype is designed in this paper to assess the capability of commercial flickermeters. In accordance with the latest International Electrotechnical Commission (IEC) standards, the test power signals can be generated and the standard flicker indices can be precisely obtained by designed autoregressive (AR)-model-based synchronization and voltage envelope extraction processes. In this way, the commercial flickermeters can be conveniently calibrated to meet the measurement requirements during the continuous operation of wind turbine.
    Relation: roceedings of the 15th IEEE International Conference on Harmonics and Quality of Power
    Appears in Collections:[Department of Computer Science and Information Engineering] Proceedings

    Files in This Item:

    File SizeFormat
    index.html0KbHTML487View/Open


    All items in ASIAIR are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - Feedback