ASIA unversity:Item 310904400/25323
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    题名: A new process capability analysis chart approach on the chip resistor quality management
    作者: 歐陽良裕;Ouyang, Liang-Yuh;許昌賢;Hsu, Chang-Hsien;楊俊明;Yang, Chun-Ming
    贡献者: 經營管理學系
    关键词: Accuracy;discrimination distance;precision;process capability analysis chart;process capability indices
    日期: 2013
    上传时间: 2013-07-11 06:16:02 (UTC+0)
    摘要: Process capability indices have been extensively used to determine whether the quality characteristics of the product meet the preset targets of the customer in manufacturing industries. However, these existing process capability indices cannot categorically determine improvement priorities for substandard quality characteristics. Besides, process capability indices also cannot effectively identify and measure deficiencies in process capability owing to accuracy, precision, or both. In this study, we combine the process capability index Cpm, minimum individual process capability C0, accuracy A, and precision P to develop a new process capability analysis chart. Managers can apply process capability analysis chart to identify the substandard quality characteristics of the product. Furthermore, if the budget for all substandard quality characteristics improvements is limited, we use the discrimination distance method to measure and determine improvement priorities for substandard quality characteristics. Moreover, we construct an implementation flowchart of the process capability analysis chart to derive the results easily. Finally, an example of a chip resistor is presented to illustrate the applicability of the process capability analysis chart for manufacturing quality management.
    關聯: Proceedings Of The Institution Of Mechanical Engineers Part B-Journal Of Engineering Manufacture
    显示于类别:[經營管理學系 ] 期刊論文

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