A pattern deformational model and Bayes error-correcting recognition system

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题名:	A pattern deformational model and Bayes error-correcting recognition system
作者:	TSAI, W-H FU, K-S
贡献者:	Asia University
日期:	1979-12
上传时间:	2009-10-23 06:29:21 (UTC+0)
摘要:	A pattern deformational model is proposed in this paper. Pattern deformations are categorized into two types: local deformation and structural deformation. A structure-preserving local deformation can be decomposed into a syntactic deformation followed by a semantic deformation, the former being induced on primitive structures and the latter on primitive properties. Bayes error-correcting parsing algorithms are proposed accordingly which not only can perform normal syntax analysis but also can make statistical decisions. An optimum Bayes error-correcting recognition system is then formulated for pattern classification. The system can be considered as a hybrid pattern classifier which uses both syntactic and statistical pattern recognition techniques.
關聯:	IEEE Transactions on Systems, Man, and Cybernetics SMC-9:745-756
显示于类别:	[資訊工程學系] 期刊論文

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