Automatic thresholding for defect detection

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題名:	Automatic thresholding for defect detection
作者:	黃惠藩;Ng, Hui-Fuang
貢獻者:	資訊工程學系
關鍵詞:	Automatic thresholding;Defect detection
日期:	2006-10
上傳時間:	2012-11-26 05:55:25 (UTC+0)
摘要:	Automatic thresholding has been widely used in the machine vision industry for automated visual inspection of defects. A commonly used thresholding technique, the Otsu method, provides satisfactory results for thresholding an image with a histogram of bimodal distribution. This method, however, fails if the histogram is unimodal or close to unimodal. For defect detection applications, defects can range from no defect to small or large defects, which means that the gray-level distributions range from unimodal to bimodal. For this paper, we revised the Otsu method for selecting optimal threshold values for both unimodal and bimodal distributions, and tested the performance of the revised method, the valley-emphasis method, on common defect detection applications.
關聯:	Pattern Recognition Letters; 27(14):1644–1649
顯示於類別:	[資訊工程學系] 期刊論文

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