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    ASIA unversity > 資訊學院 > 光電與通訊學系 > 期刊論文 >  Item 310904400/17167


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/17167


    Title: Analysis of LDMOS for Effect of Fingers, Device-Width and Inductance (Load) on Reverse Recovery
    Authors: 蔡宗叡;Tsai, Jung-Ruey;楊紹明;Yang, Shao-Ming;許健;Sheu, Gene
    Contributors: 光電與通訊學系
    Date: 2012-03
    Issue Date: 2012-11-26 02:22:51 (UTC+0)
    Relation: Advanced Materials Research
    Appears in Collections:[光電與通訊學系] 期刊論文

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