Development of a smaller-the-better process capability analysis model under a sampling inspection plan

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題名:	Development of a smaller-the-better process capability analysis model under a sampling inspection plan
作者:	許昌賢;Chang-Hsien,Hsu
貢獻者:	經營管理學系
日期:	2017-03
上傳時間:	2017-12-08 06:44:43 (UTC+0)
摘要:	In practice, quality managers often employ sampling inspection to test and evaluate process performance or product quality instead of a 100% inspection, owing to cost and time considerations. Based on this factor, this article develops a smaller-the-better process capability analysis model (SBPCAM) to measure whether process capability of a product with multiple quality characteristics conforms to customer requirements, based on the process capability index (PCI) of smaller-the-better C_(pu) with the functions of the accuracy index (A) and the precision index (P). In the proposed method, a control chart with joint confidence blocks (JCB) is used to reduce sampling error and to improve the reliability of the point estimate of index C_(pu). A numerical example is provided to illustrate the feasibility and effectiveness of the proposed method.
關聯:	International Journal of Information and Management Sciences
顯示於類別:	[經營管理學系 ] 期刊論文

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