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    ASIA unversity > 資訊學院 > 資訊工程學系 > 博碩士論文 >  Item 310904400/107808


    Please use this identifier to cite or link to this item: http://asiair.asia.edu.tw/ir/handle/310904400/107808


    Title: UMOS功率元件電源損耗之研究
    Authors: 吳景淵
    Contributors: 資訊工程學系
    Keywords: U型溝槽功率元件;功率損耗;閘極電荷;降低表面電場原理;切換損耗
    Date: 2017
    Issue Date: 2017-09-18 03:11:21 (UTC+0)
    Publisher: 亞洲大學
    Abstract: 本論文的研究重點為U型槽金氧半電晶體(U shaped trench MOS),此功率元件已被廣泛使用於汽車電子、驅動整流、電源供應等…各領域之上,其中本論文所探討之功率元件有最低導通電組(Lowest Ron)即為在使用下,所消耗的能量為最低,並能夠用於200V範圍內,且元件尺寸上為垂直U型槽,故能大幅減少面積,提高密集度。
    本論文透過TCAD模套件,Tsuprem4建構元件製程與Sdevice、Medici軟體分析特性,其中UMOS之技術價值為FOM(figure of merit)=
    Appears in Collections:[資訊工程學系] 博碩士論文

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