Among the many kinds of networking technologies, the wireless ad hoc network is an important one for creating high-performance ubiquitous computing systems. The availability of a wireless ad hoc network (WANET) depends highly upon the level of node reliability. System-level fault diagnosis has long been a subject for the purpose of maintaining system reliability. This paper addresses the comparison-based approach to fault detection, and accordingly, we developed a localized algorithm for detecting faulty nodes in strongly one-step t-diagnosable WANETs. The contributions of this paper are highlighted as follows: (i) A localized fault detection algorithm is proposed for strongly one-step t-diagnosable WANETs under the comparison model, (ii) the proposed algorithm is formally proved, and it incurs only linear time complexity, which is relatively efficient compared to some others in literature, and (iii) some examples are presented for clarifying how to accomplish the comparison-based fault detection process.
Relation:
EURASIP Journal on Wireless Communications and Networking
